Automatic Generation of Microprocessor Test Programs
- 1 January 1982
- proceedings article
- Published by Institute of Electrical and Electronics Engineers (IEEE)
- p. 566-573
- https://doi.org/10.1109/dac.1982.1585554
Abstract
This paper presents an automatic generation system for behavioral test programs of microprocessors. First, the test environment is presented, as well as its consequences on test program generation. In the second part, the test principles are outlined; it is a behavioral test, i.e a test determined from the user's description of the microprocessor; the resulting test programs are quite modular. The third part presents the description language and the generation system.Keywords
This publication has 2 references indexed in Scilit:
- RANDOM TESTING OF THE DATA PROCESSING SECTION OF A MICROPROCESSORPublished by Institute of Electrical and Electronics Engineers (IEEE) ,2005
- Hardware Description Levels and Test for Complex CircuitsPublished by Institute of Electrical and Electronics Engineers (IEEE) ,1981