Dopant Loss Mechanism in n[sup +]∕p Germanium Junctions during Rapid Thermal Annealing
- 1 January 2005
- journal article
- Published by The Electrochemical Society in Journal of the Electrochemical Society
- Vol. 152 (12) , G895
- https://doi.org/10.1149/1.2073048
Abstract
No abstract availableKeywords
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