X-ray interferometry and lattice parameter investigation
Open Access
- 1 January 1976
- journal article
- Published by EDP Sciences in Revue de Physique Appliquée
- Vol. 11 (1) , 83-87
- https://doi.org/10.1051/rphysap:0197600110108300
Abstract
The essentials of X-ray interferometry and its principal application fields are reviewed. Very small lattice disturbances which are present even in highest quality crystals of silicon have been investigated by ordinary and moire topography. Strains corresponding to Δd/d variations of 10 -7 are found in large perfect crystalsKeywords
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