Junction depth dependence of breakdown in silicon detector diodes
- 1 April 1996
- journal article
- Published by Elsevier in Nuclear Instruments and Methods in Physics Research Section A: Accelerators, Spectrometers, Detectors and Associated Equipment
- Vol. 373 (2) , 223-226
- https://doi.org/10.1016/0168-9002(96)00015-0
Abstract
No abstract availableKeywords
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