C-MOS/SOS LSI input/Output protection networks
- 1 August 1978
- journal article
- Published by Institute of Electrical and Electronics Engineers (IEEE) in IEEE Transactions on Electron Devices
- Vol. 25 (8) , 933-938
- https://doi.org/10.1109/t-ed.1978.19204
Abstract
An improved input and output electrical surge protection has been developed for C-MOS and MNOS large-scale integrated circuitry fabricated on sapphire. The failure mode was designed to be the input- or output-series limiting diffused resistor, which can be controlled reliably through the fabrication processes. Forward-bias diodes attenuate the overvoltage surges. Failure energies and voltages have been evaluated, and design equations are developed and verified.Keywords
This publication has 4 references indexed in Scilit:
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- Determination of Threshold Failure Levels of Semiconductor Diodes and Transistors Due to Pulse VoltagesIEEE Transactions on Nuclear Science, 1968