Convergent-beam techniques in transmission electron microscopy

This publication has 31 references indexed in Scilit:

• A study of a cellular phase transformation in the ternary Ni- Ai- Mo alloy system
  Metallurgical Transactions A, 1983
• Use of high-symmetry zone axes in electron diffraction in determining crystal point and space groups
  Journal of Applied Crystallography, 1983
• Point-group determination by convergent-beam electron diffraction
  Acta Crystallographica Section A Foundations of Crystallography, 1983
• Foil thickness measurements from convergent-beam diffraction patterns An experimental assessment of errors
  Philosophical Magazine A, 1982
• Foil thickness measurements from convergent-beam diffraction patterns
  Philosophical Magazine A, 1981
• Electron diffraction methods in TEM, STEM and SEM
  Scanning, 1979
• On the relationship between projected crystal potential and the form of certain zone axis patterns in high energy electron diffraction
  Philosophical Magazine, 1977
• The symmetry of electron diffraction zone axis patterns
  Philosophical Transactions of the Royal Society of London. Series A, Mathematical and Physical Sciences, 1976
• The determination of foil thickness by scanning transmission electron microscopy
  Physica Status Solidi (a), 1975
• Extinction conditions in the dynamic theory of electron diffraction
  Acta Crystallographica, 1965