Electron diffraction methods in TEM, STEM and SEM
- 1 January 1979
- Vol. 2 (1) , 3-19
- https://doi.org/10.1002/sca.4950020101
Abstract
No abstract availableThis publication has 42 references indexed in Scilit:
- A method for accurately determining lattice parameters using electron diffraction in a commercial electron microscopeJournal of Microscopy, 1974
- Some developments in S.E.M. instrumentationRevue de Physique Appliquée, 1974
- Observation of background contrast in convergent beam patternsActa Crystallographica Section A, 1972
- Struktur- und Absorptionspotentiale von KCl und NaCl aus Beugungsaufnahmen im konvergenten ElektronenbündelThe European Physical Journal A, 1970
- Reciprocity in electron diffraction and microscopyActa Crystallographica Section A, 1968
- Small Angle Electron Scattering from Vacuum Condensed Metallic Films I. TheoryPhysica Status Solidi (b), 1967
- Improved Scanning Electron Diffraction SystemReview of Scientific Instruments, 1965
- Scanning electron diffraction with energy analysisJournal of Scientific Instruments, 1965
- Dynamische Anomalie von ElektroneninterferenzenAnnalen der Physik, 1942
- Elektronenbeugung in weiten WinkelnThe European Physical Journal A, 1933