XPS with fast-frozen samples: A renewed approach to study the real mineral/solution interface
- 1 June 2005
- journal article
- Published by Elsevier in Surface Science
- Vol. 584 (1) , 106-112
- https://doi.org/10.1016/j.susc.2005.01.060
Abstract
No abstract availableThis publication has 12 references indexed in Scilit:
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