Electrical Double-Layer Structure at the Rutile–Water Interface as Observed in Situ with Small-Period X-Ray Standing Waves
- 1 May 2000
- journal article
- Published by Elsevier in Journal of Colloid and Interface Science
- Vol. 225 (1) , 154-165
- https://doi.org/10.1006/jcis.2000.6756
Abstract
No abstract availableKeywords
This publication has 26 references indexed in Scilit:
- A model of surface site types on oxide and silicate minerals based on crystal chemistry; implications for site types and densities, multi-site adsorption, surface infrared spectroscopy, and dissolution kineticsAmerican Journal of Science, 1998
- Direct Measurement of Diffuse Double-Layer Forces at the Semiconductor/Electrolyte Interface Using an Atomic Force MicroscopeThe Journal of Physical Chemistry B, 1997
- Bromide Adsorption on Ag(001): A Potential Induced Two-Dimensional Ising Order-Disorder TransitionPhysical Review Letters, 1997
- Relaxation of-() Using Surface X-Ray DiffractionPhysical Review Letters, 1997
- Evaluation of the counterion distribution around spherical micelles in solution by small-angle neutron scatteringPhysical Review E, 1996
- Diffuse-Double Layer at a Membrane-Aqueous Interface Measured with X-Ray Standing WavesScience, 1990
- Direct Measurement of Counterion Distribution around Cylindrical Micelles by Small-Angle X-Ray ScatteringPhysical Review Letters, 1988
- Determination of the position and vibrational amplitude of an adsorbate by means of multiple-order x-ray standing-wave measurementsPhysical Review B, 1985
- Infra-red studies of rutile surfaces. Part 2.—Hydroxylation, hydration and structure of rutile surfacesTransactions of the Faraday Society, 1971
- Detection of Foreign Atom Sites by Their X-Ray Fluorescence ScatteringPhysical Review Letters, 1969