Determination of the position and vibrational amplitude of an adsorbate by means of multiple-order x-ray standing-wave measurements

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Abstract
For a submonolayer of Br atoms adsorbed onto a real Ge(111) surface, x-ray interference fields were used to determine the Br position with respect to the substrate (111) and (333) diffraction planes. The results from both the (111) and (333) measurements are consistent with the onefold-atop-site surface model. The increase in local sensitivity from using the (333) diffraction planes also enabled us to demonstrate the use of x-ray interference fields for determining the vibrational amplitude of an adsorbate.