Vacuum-ultraviolet radiation damage of the KCl surface—application of combined spectroscopic ellipsometry and reflectometry
- 1 June 1978
- journal article
- Published by Elsevier in Surface Science
- Vol. 74 (3) , 568-594
- https://doi.org/10.1016/0039-6028(78)90015-8
Abstract
No abstract availableThis publication has 40 references indexed in Scilit:
- The effect of sample imperfections in wavelength-scanning polarization-modulation ellipsometryOptics Communications, 1977
- Ellipsometric study of F-centres in electron-bombarded KClJournal of Physics C: Solid State Physics, 1977
- Ellips — A FORTRAN simulation of a polarization-modulation ellipsometerComputer Physics Communications, 1977
- Quantitative determination of water coverage on KCl(001) by secondary ion mass spectroscopyThe Journal of Chemical Physics, 1977
- Exciton-Induced Photoemission from KCl FilmsJournal of Applied Physics, 1971
- Particle size effects on the energies of bulk and surface F-centresTransactions of the Faraday Society, 1971
- Studies of alkali halide films deposited at low temperatures. Electron microscopy, electronic spectra from colour centres and infra-red spectra from the chemisorption of nitric oxideTransactions of the Faraday Society, 1971
- Ellipsometric Technique for Obtaining Substrate Optical ConstantsJournal of Applied Physics, 1970
- Evolution of Water from Alkali Halide Single CrystalsJournal of Applied Physics, 1968
- Interaction of Slow Electrons With Insulating Crystals. 2. Comparison of Electron and Photon Absorption Coefficients for KCl and KBrPhysical Review B, 1961