Ellips — A FORTRAN simulation of a polarization-modulation ellipsometer
- 31 October 1977
- journal article
- Published by Elsevier in Computer Physics Communications
- Vol. 13 (3) , 207-224
- https://doi.org/10.1016/0010-4655(77)90015-7
Abstract
No abstract availableKeywords
This publication has 17 references indexed in Scilit:
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- Calibration of Ellipsometer Divided Circles*Journal of the Optical Society of America, 1971
- General Treatment of the Effect of Cell Windows in Ellipsometry*Journal of the Optical Society of America, 1971
- Unified Analysis of Ellipsometry Errors Due to Imperfect Components, Cell-Window Birefringence, and Incorrect Azimuth Angles*Journal of the Optical Society of America, 1971
- Analyses and Corrections of Instrumental Errors in EllipsometryJournal of the Optical Society of America, 1970
- An Improved Method for High Reflectivity Ellipsometry Based on a New Polarization Modulation TechniqueReview of Scientific Instruments, 1970
- An Improved Method for High Reflectivity Ellipsometry Based on a New Polarization Modulation TechniqueReview of Scientific Instruments, 1969