A differential ellipsometer
- 1 November 1974
- journal article
- research article
- Published by AIP Publishing in Review of Scientific Instruments
- Vol. 45 (11) , 1464-1465
- https://doi.org/10.1063/1.1686532
Abstract
A system is described which provides for direct measurement of the difference between linear dichroism, circular dichroism, or phase shifts (in transmission or reflection) of two adjacent samples. A uniaxial crystal is used to produce two incident light beams of mutually orthogonal polarization. The total intensity is analyzed by a single detector to give the differential quantities.Keywords
This publication has 3 references indexed in Scilit:
- Use of a Stable Polarization Modulator in a Scanning Spectrophotometer and EllipsometerReview of Scientific Instruments, 1973
- Test of the Virtual-Level Model of Dilute AlloysPhysical Review B, 1973
- An Improved Method for High Reflectivity Ellipsometry Based on a New Polarization Modulation TechniqueReview of Scientific Instruments, 1969