Test Application Timing: The Unexplored Issue in AC Test
- 24 August 2005
- conference paper
- Published by Institute of Electrical and Electronics Engineers (IEEE)
Abstract
No abstract availableKeywords
This publication has 3 references indexed in Scilit:
- On computing the sizes of detected delay faultsIEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems, 1990
- Timing analysis using functional analysisIEEE Transactions on Computers, 1988
- Transition Fault SimulationIEEE Design & Test of Computers, 1987