Quantitative analysis of overlapping XPS peaks by spectrum reconstruction: determination of the thickness and composition of thin iron oxide films
- 1 October 1998
- journal article
- Published by Wiley in Surface and Interface Analysis
- Vol. 26 (11) , 773-782
- https://doi.org/10.1002/(sici)1096-9918(199810)26:11<773::aid-sia419>3.0.co;2-#
Abstract
No abstract availableThis publication has 34 references indexed in Scilit:
- On the initial oxidation of iron: Quantification of growth kinetics by the coupled-currents approachJournal of Applied Physics, 1997
- Growth kinetics of thin oxide layers; oxidation of Fe and Fe−N phases at room temperatureThin Solid Films, 1996
- Generalization of the tougaard method for inelastic-background estimation in electron spectroscopy: Incorporation of a depth-dependent inelastic mean free pathSurface and Interface Analysis, 1995
- Application of tougaard background subtraction to XPS spectra of passivated Fe–17 CrSurface and Interface Analysis, 1994
- The depth distribution function in Auger/XPS analysisSurface and Interface Analysis, 1992
- Separation of spectral components and depth profiling through inelastic background analysis of XPS spectra with overlapping peaksSurface and Interface Analysis, 1991
- Quantitative analysis of the inelastic background in surface electron spectroscopySurface and Interface Analysis, 1988
- An X-ray photoelectron spectroscopy study of the chemical changes in oxide and hydroxide surfaces induced by Ar+ ion bombardmentThin Solid Films, 1978
- Relative intensities in x-ray photoelectron spectraJournal of Electron Spectroscopy and Related Phenomena, 1973
- High-Resolution X-Ray Photoemission Spectrum of the Valence Bands of GoldPhysical Review B, 1972