The influence of SEM preparation on the electrical properties of silicon devices
- 1 January 1984
- Vol. 6 (2) , 36-43
- https://doi.org/10.1002/sca.4950060205
Abstract
No abstract availableKeywords
This publication has 2 references indexed in Scilit:
- Surface effects on p-n junctions: Characteristics of surface space-charge regions under non-equilibrium conditionsSolid-State Electronics, 1966
- Sperrkennlinien mit Oberflächendurchbruch von Silicium-p sp n-GleichrichternZeitschrift für Naturforschung A, 1960