Normal Photoelectron Diffraction of the SeLevel in Se Overlayers on Ni(100)
- 27 November 1978
- journal article
- research article
- Published by American Physical Society (APS) in Physical Review Letters
- Vol. 41 (22) , 1565-1568
- https://doi.org/10.1103/physrevlett.41.1565
Abstract
Modulations of up to a factor of 2 were observed in the Se photoelectron intensity normal to the surface, for selenium overlayers on Ni(100), as the photon energy was varied from 90 to 240 eV. Excellent agreement of peak energies with predictions by Tong and Li was obtained for both the and structures, using the hollow-site geometry. Normal photoelectron diffraction appears to have promise as a surface structural method.
Keywords
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