Chemical microanalysis by x-ray microscopy near absorption edge with synchrotron radiation

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Abstract
The use of synchrotron radiation is shown to give promising properties to x‐ray absorption microanalysis. Geological samples, 30 μm thick, have been analyzed over large areas with a few micrometers resolution, and maps of transition‐metal distributions were obtained in less than 15 min. An increased resolution is expected with x‐ray resists.