Highly mobile oxygen hole-type charge carriers in fused silica
- 1 August 1991
- journal article
- Published by Springer Nature in Journal of Materials Research
- Vol. 6 (8) , 1619-1622
- https://doi.org/10.1557/jmr.1991.1619
Abstract
Some peculiar positive charge carriers are thermally generated in fused silica above 500 °C. These charge carriers appear to be positive holes, chemically O− states, probably arising from dissociation of peroxy defects. The charge carriers give rise to a pronounced positive surface charge which disappears upon cooling but can be quenched by rapid quenching from ≍800 °C. Reheating to ≍200 °C remobilizes these charge carriers and causes them to anneal below 400 °C. The generation of positive holes charge carriers may be important to understand failure mechanisms of SiO2 insulators.Keywords
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