Ellipsometric and infrared spectroscopic studies of oxide film on GaAs surface
- 2 July 1979
- journal article
- Published by Elsevier in Surface Science
- Vol. 86, 314-321
- https://doi.org/10.1016/0039-6028(79)90409-6
Abstract
No abstract availableFunding Information
- Ministry of Education
This publication has 5 references indexed in Scilit:
- Anodic Oxidation of GaAs in Mixed Solutions of Glycol and WaterJournal of the Electrochemical Society, 1976
- Anodic Oxidation of GaAs as a Technique to Evaluate Electrical Carrier Concentration ProfilesJournal of the Electrochemical Society, 1975
- Improved method of anodic oxidation of GaAsElectronics Letters, 1975
- Native Oxide Mask for Zinc Diffusion in Gallium ArsenideJournal of the Electrochemical Society, 1974
- Determination of the Properties of Films on Silicon by the Method of EllipsometryJournal of the Optical Society of America, 1962