Response of advanced bipolar processes to ionizing radiation

This publication has 22 references indexed in Scilit:

• Mechanisms of ionizing-radiation-induced degradation in modern bipolar devices
  Published by Institute of Electrical and Electronics Engineers (IEEE) ,2002
• The direct measurement of dose enhancement in gamma test facilities
  IEEE Transactions on Nuclear Science, 1989
• Using laboratory X-ray and cobalt-60 irradiations to predict CMOS device response in strategic and space environments
  IEEE Transactions on Nuclear Science, 1988
• Post-Irradiation Effects in Field-Oxide Isolation Structures
  IEEE Transactions on Nuclear Science, 1987
• The Effects of Radiation on Electronic Systems
  Published by Springer Nature ,1986
• Total Dose Hardness Assurance for Microcircuits for Space Environment
  IEEE Transactions on Nuclear Science, 1986
• Total-Dose Radiation and Annealing Studies: Implications for Hardness Assurance Testing
  IEEE Transactions on Nuclear Science, 1986
• Total Dose Indujced Hole Trapping and Interface State Generation in Bipolar Recessed Field Oxides
  IEEE Transactions on Nuclear Science, 1985
• Charge and Interface State Generation in Field Oxides
  IEEE Transactions on Nuclear Science, 1984
• Physical Mechanisms Contributing to Device "Rebound"
  IEEE Transactions on Nuclear Science, 1984