Mechanisms of ionizing-radiation-induced degradation in modern bipolar devices

This publication has 7 references indexed in Scilit:

• An investigation of nonideal base currents in advanced self-aligned 'etched-polysilicon' emitter bipolar transistors
  IEEE Transactions on Electron Devices, 1991
• Electron-beam damage of self-aligned silicon bipolar transistors and circuits
  IEEE Transactions on Electron Devices, 1991
• Modeling hot-carrier effects in polysilicon emitter bipolar transistors
  IEEE Transactions on Electron Devices, 1988
• Two-dimensional effects in the bipolar polysilicon self-aligned transistor
  IEEE Transactions on Electron Devices, 1987
• Models for Total Dose Degradation of Linear Integrated Circuits
  IEEE Transactions on Nuclear Science, 1987
• A Comparison of Radiation Damage in Linear ICs from COBALT-60 Gamma Rays and 2.2 MeV Electrons
  IEEE Transactions on Nuclear Science, 1983
• Hardness Assurance Considerations for Long-Term Ionizing Radiation Effects on Bipolar Structures
  IEEE Transactions on Nuclear Science, 1978