Elemental analysis of mixed lanthanide crystals using proton-induced K X-ray emission
- 1 June 1984
- journal article
- Published by Elsevier in Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms
- Vol. 4 (1) , 107-113
- https://doi.org/10.1016/0168-583x(84)90049-1
Abstract
No abstract availableKeywords
This publication has 11 references indexed in Scilit:
- Dynamic ion exchange chromatography for determination of number of fissions in thorium-uranium dioxide fuelsAnalytical Chemistry, 1984
- Electric susceptibility of mixed cerium/lanthanum ethyl sulfate crystalsJournal of Low Temperature Physics, 1983
- Heavy element (Z > 30) thick-target gamma-ray yields induced by 1.7 and 2.4 MeV protonsNuclear Instruments and Methods in Physics Research, 1983
- Bulk elemental analysis using γ rays from inelastic scattering of neutrons produced by the 13C(α,n)16O reactionNuclear Instruments and Methods in Physics Research, 1982
- Determination of rare earth elements in geological materials by inductively coupled argon plasma/atomic emission spectrometryAnalytical Chemistry, 1982
- Spatial intensity profile characterisation for an external beam from a proton microprobeNuclear Instruments and Methods in Physics Research, 1982
- Materials analysis with an external beam proton microprobeNuclear Instruments and Methods in Physics Research, 1981
- Quantitative analysis by proton-induced X-ray emission utilizing an inexpensive external-beam systemNuclear Instruments and Methods, 1979
- A survey of the analytical significance of prompt gamma-rays induced by 5 MeV alpha-particlesJournal of Radioanalytical and Nuclear Chemistry, 1979
- Quantitative analysis of complex targets by proton-induced x raysJournal of Applied Physics, 1975