Experiments to determine the mean depth scale of positrons in silicon: slow positron beam measurements on MBE-grown silicon layers on silicon oxide
- 1 May 1997
- journal article
- Published by Elsevier in Applied Surface Science
- Vol. 116, 247-250
- https://doi.org/10.1016/s0169-4332(96)01063-x
Abstract
No abstract availableKeywords
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