Defect profiling in elemental and multilayer systems: correlations of fitted defect concentrations with positron implantation profiles
- 1 January 1995
- journal article
- Published by Elsevier in Applied Surface Science
- Vol. 85, 210-215
- https://doi.org/10.1016/0169-4332(94)00333-5
Abstract
No abstract availableKeywords
This publication has 4 references indexed in Scilit:
- Defect profiling in multilayered systems using mean depth scalingApplied Surface Science, 1995
- Positron stopping profiles in multilayered systemsJournal of Applied Physics, 1994
- Simple scaling law for positron stopping in multilayered systemsApplied Physics Letters, 1994
- Interaction of positron beams with surfaces, thin films, and interfacesReviews of Modern Physics, 1988