Analysis on yield of integrated circuits and a new expression for the yield
- 1 January 1972
- journal article
- research article
- Published by Wiley in Electrical Engineering in Japan
- Vol. 92 (6) , 135-141
- https://doi.org/10.1002/eej.4390920619
Abstract
No abstract availableThis publication has 5 references indexed in Scilit:
- Comments on "A new look at yield of integrated circuits"Proceedings of the IEEE, 1971
- A new look at yield of integrated circuitsProceedings of the IEEE, 1970
- Sources of residual frequency modulation in X-band two-cavity klystron oscillatorsIEEE Transactions on Electron Devices, 1968
- Current Status of Large Scale Integration TechnologyIEEE Journal of Solid-State Circuits, 1967
- Cost-size optima of monolithic integrated circuitsProceedings of the IEEE, 1964