Projected Range Distribution of Implanted Ions in a Double-Layer Substrate
- 1 January 1975
- book chapter
- Published by Springer Nature
Abstract
No abstract availableKeywords
This publication has 6 references indexed in Scilit:
- Threshold voltage and ``gain'' term β of ion-implanted enhancement-mode n-channel MOS transistorsApplied Physics Letters, 1973
- Physical Profile Measurements in Insulating Layers Using the Ion AnalyserPublished by Springer Nature ,1973
- Range Distribution Theory Based on Energy Distribution of Implanted IonsJournal of Applied Physics, 1972
- A complementary MOS 1.2 volt watch circuit using ion implantationSolid-State Electronics, 1972
- THE ADJUSTMENT OF MOS TRANSISTOR THRESHOLD VOLTAGE BY ION IMPLANTATIONApplied Physics Letters, 1971
- MOS field effect transistors formed by gate masked ion implantationIEEE Transactions on Electron Devices, 1968