On the application of probabilistic distance measures for the extraction of features from imperfectly labeled patterns
- 1 June 1973
- journal article
- Published by Springer Nature in International Journal of Parallel Programming
- Vol. 2 (2) , 103-114
- https://doi.org/10.1007/bf00976057
Abstract
No abstract availableKeywords
This publication has 9 references indexed in Scilit:
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