Deep-level traps and the conduction-band structure of InP
- 1 December 1978
- journal article
- research article
- Published by AIP Publishing in Applied Physics Letters
- Vol. 33 (11) , 957-959
- https://doi.org/10.1063/1.90233
Abstract
Three traps found in n‐type InP with emission activation energies ΔEe=0.43, 0.59, and 0.63 eV are analyzed. The position of the energy levels for these traps, relative to the lowest conduction‐band minimum Γ, are ET=0.34, 0.20, and 0.24 eV, respectively. It is shown that the 0.43‐eV trap emits to and captures electrons from the Γ minimum and exhibits a thermally activated capture cross section with a barrier energy of 0.09 eV. Very good agreement is found between the capture cross sections derived from capture and from emission experiments: σ∞=3.4×10−15 and 5.8×10−15 cm2, respectively. It is concluded from detailed emission and capture studies that the 0.59‐ and 0.63‐eV traps emit and capture carriers via the higher‐lying L minima. A value of 0.39 eV for the intervalley L‐Γ energy separation is consistent with the observed emission and capture properties of both centers.Keywords
This publication has 7 references indexed in Scilit:
- Deep traps in ideal n-InP Schottky diodesElectronics Letters, 1978
- Pressure dependence of the deep level associated with oxygen in n-GaAsApplied Physics Letters, 1978
- Photocapacitance effects of deep traps in n-type InPJournal of Applied Physics, 1978
- Deep-level transient spectroscopy: A new method to characterize traps in semiconductorsJournal of Applied Physics, 1974
- High-field transport in gallium arsenide and indium phosphideJournal of Physics C: Solid State Physics, 1974
- The conduction band structures of GaAs and InPJournal of Physics C: Solid State Physics, 1973
- Cyclotron resonance with epitaxial films of n type inpJournal of Physics C: Solid State Physics, 1971