Thermal diffusivity measurements by photothermal laser beam deflection (PTD): data analysis using the Levenberg—Marquardt algorithm
- 1 July 1992
- journal article
- Published by Elsevier in Thin Solid Films
- Vol. 215 (1) , 103-107
- https://doi.org/10.1016/0040-6090(92)90709-k
Abstract
No abstract availableKeywords
This publication has 7 references indexed in Scilit:
- Thermal diffusivity of isotopically enricheddiamondPhysical Review B, 1990
- Fundamentals and applications of variable angle spectroscopic ellipsometryMaterials Science and Engineering: B, 1990
- Study of temperature-dependent ultrathin oxide growth on Si(111) using variable-angle spectroscopic ellipsometryThin Solid Films, 1990
- Variable wavelength, variable angle ellipsometry including a sensitivities correlation testThin Solid Films, 1986
- Absolute measurement of optical attenuationApplied Physics Letters, 1983
- Thermal effects in photothermal spectroscopy and photothermal imagingJournal of Applied Physics, 1983
- Thermo-optical spectroscopy: Detection by the ’’mirage effect’’Applied Physics Letters, 1980