Trap-Assisted Tunneling in MIS and Schottky Structures
- 16 September 1983
- journal article
- research article
- Published by Wiley in Physica Status Solidi (a)
- Vol. 79 (1) , 223-236
- https://doi.org/10.1002/pssa.2210790125
Abstract
No abstract availableKeywords
This publication has 17 references indexed in Scilit:
- Resonant tunnel switching in MISS devicesSolid-State Electronics, 1982
- On the resonant broadening of the trap assisted tunneling in MIM structuresPhysica Status Solidi (a), 1981
- Resonant tunnelling in thermally degenerated molybdenum and platinum silicon Schottky diodesPhysica Status Solidi (a), 1980
- Zero Bias Anomaly Due to Elastic Tunneling in MIM StructuresPhysica Status Solidi (a), 1979
- Resonant tunneling current for general junction potential barrierPhysica Status Solidi (a), 1979
- Evaluation of the tunnelling current assisted by deep traps in schottky barriersRevue de Physique Appliquée, 1977
- Resonant tunneling through traps in Schottky barriersJournal de Physique, 1977
- Correlations of the 4.77–4.28-eV luminescence band in silicon dioxide with the oxygen vacancyJournal of Applied Physics, 1976
- Resonant tunneling through Schottky barriersApplied Physics Letters, 1976
- Tunneling in CdTe Schottky BarriersPhysical Review B, 1969