Metallurgical and electrical characterization of metal-semiconductor contacts
- 1 September 1980
- journal article
- Published by Elsevier in Thin Solid Films
- Vol. 72 (1) , 129-142
- https://doi.org/10.1016/0040-6090(80)90566-0
Abstract
No abstract availableThis publication has 15 references indexed in Scilit:
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