Atomic Arrangement of the Si(111)-√3×√3-Ag Structure Derived from Low-Energy Ion-Scattering Spectroscopy
- 1 July 1980
- journal article
- Published by IOP Publishing in Japanese Journal of Applied Physics
- Vol. 19 (7) , L421
- https://doi.org/10.1143/jjap.19.l421
Abstract
Si(111)-√3×√3-Ag surface structure has been studied by low-energy ion-scattering spectroscopy using neon ions with an energy of 500 eV, combined with LEED-AES. It has been proposed that Ag atoms giving rise to the √3 structure are slightly embedded below the outermost Si layer, including consequent displacements of the substrate Si atoms.Keywords
This publication has 15 references indexed in Scilit:
- Structure analysis of an oxidized nickel (110) surface using low energy ion scatteringSurface Science, 1979
- Oxygen adsorption on Cu(10): Determination of atom positions with low energy ion scatteringSurface Science, 1979
- Cohesive energy of the two-dimensional Si(111)3 × 1 Ag and Si(111)√3-R(30°)Ag phases of the Silver (deposit)-silicon(111) (substrate) systemSurface Science, 1978
- The backscattering of low energy ions and surface structureSurface Science, 1977
- The structure of oxygen adsorbed on Ni(001) as determined by ion scattering spectroscopySurface Science, 1976
- Oxygen adsorption on (110) silverSurface Science, 1975
- Quantitative aspects of Ion Scattering Spectroscopy (ISS)Surface Science, 1975
- Low energy ion scattering and Auger electron spectroscopy studies of clean nickel surfaces and adsorbed layersSurface Science, 1975
- Analysis of the outermost atomic layer of a surface by low-energy ion scatteringSurface Science, 1973
- Energy distributions of low-energy noble gas ions backscattered from a single-crystal nickel surfaceSurface Science, 1973