Two-Signal Method of Measuring the Large-Signal S-Parameters of Transistors
- 1 June 1978
- journal article
- Published by Institute of Electrical and Electronics Engineers (IEEE) in IEEE Transactions on Microwave Theory and Techniques
- Vol. 26 (6) , 417-420
- https://doi.org/10.1109/tmtt.1978.1129404
Abstract
No abstract availableThis publication has 7 references indexed in Scilit:
- New algorithms for synthesized design of optical filtersApplied Optics, 1985
- An experimental methods of characterizing nonlinear 2-ports and its application to microwave class-C transistor power amplifier designIEEE Journal of Solid-State Circuits, 1977
- Characterisation of nonlinear 2-ports for the design of class-C amplifiersIEE Journal on Microwaves, Optics and Acoustics, 1977
- RF Amplifier Design with Large-Signal S-ParametersIEEE Transactions on Microwave Theory and Techniques, 1973
- Large-Signal S-Parameter Characterization of UHF Power TransistorsPublished by Institute of Electrical and Electronics Engineers (IEEE) ,1973
- Transistor characterization by effective large-signal two-port parametersIEEE Journal of Solid-State Circuits, 1970
- Power Waves and the Scattering MatrixIEEE Transactions on Microwave Theory and Techniques, 1965