The Form Change of Metal Thin Film as Measured by the Refracted X-Ray Fluorescence (RXF) Method
- 1 April 1991
- journal article
- Published by IOP Publishing in Japanese Journal of Applied Physics
- Vol. 30 (4B) , L761
- https://doi.org/10.1143/jjap.30.l761
Abstract
The refracted X-ray fluorescence (RXF) method can measure the form change of evaporated Mn thin film. The Mn thin film was changed from rough island thin film to flat island thin film by evaporated Au atoms. In this letter, we report that the RXF method is effective as a method of studying surfaces and interfaces.Keywords
This publication has 3 references indexed in Scilit:
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- Refraction effect of scattered X-ray fluorescence at surfaceApplied Physics A, 1990
- Interdiffusion mechanisms in Ag-Au thin-film couplesApplied Physics Letters, 1976