Layer Rigidity and Collective Effects in Pillared Lamellar Solids

Abstract
The x dependence of the normalized basal spacing, dn(x) of pillared vermiculite (Vm) has been measured for the mixed-layer system [(CH3)4N+]x[(CH3)3NH+]1xVm and compared with that of CsxRb1xVm. Both systems exhibit a nonlinear dn(x) with approximate thresholds of x0.2 and 0.5, respectively. A model which related dn(x) to layer rigidity and the binding energies of gallery and defect sites yields excellent fits to the basal spacing data and to monolayer simulations if collective effects are included. This model should be applicable to other types of lamellar solids.