Chemical State Mapping by X-Ray Fluorescence Using Absorption Edge Shifts
- 1 September 1988
- journal article
- Published by IOP Publishing in Japanese Journal of Applied Physics
- Vol. 27 (9A) , L1768
- https://doi.org/10.1143/jjap.27.l1768
Abstract
Spatial distributions of chemical states of an element were determined by the measurement of X-ray fluorescence emission based on the selective excitation. Due to the chemical shifts of absorption edges, energy dependence of the fluorescent X-rays intensity near the edge is characteristic for the chemical state. There is a certain appropriate energy which selectively excites the specific valence state. Experimental results of the chemical state mapping of Fe-O and Cr-O systems are shown. The image reconstruction technique with the line shaped incident X-rays as well as the ordinary point-by-point scanning was employed.Keywords
This publication has 9 references indexed in Scilit:
- Chemical State Analysis by X-Ray Fluorescence Using Shifts of Iron K Absorption EdgeAnalytical Sciences, 1988
- Characterization of Co–O Thin Films by X-Ray Fluorescence Using Chemical Shifts of Absorption EdgesJapanese Journal of Applied Physics, 1987
- A Scanning X-Ray Fluorescence Microprobe with Synchrotron RadiationJapanese Journal of Applied Physics, 1987
- Elemental and chemical-state imaging using synchrotron radiationApplied Optics, 1986
- Energy dispersive X-ray fluorescence analysis with synchrotron radiationNuclear Instruments and Methods in Physics Research Section A: Accelerators, Spectrometers, Detectors and Associated Equipment, 1985
- Critical absorption tomography of small samples: Proposed applications of synchrotron radiation to computerized tomography IINuclear Instruments and Methods in Physics Research, 1983
- X-Ray ImagingPublished by Springer Nature ,1980
- Element mapping by a scanning X‐ray systemX-Ray Spectrometry, 1979
- X-Ray SpectroscopyPublished by Springer Nature ,1979