Beading instabilities in thin film lines with bamboo microstructures
- 1 May 1986
- journal article
- Published by Elsevier in Thin Solid Films
- Vol. 139 (2) , 133-141
- https://doi.org/10.1016/0040-6090(86)90331-7
Abstract
No abstract availableThis publication has 7 references indexed in Scilit:
- Electromigration lifetime sudies of submicrometer-linewidth Al-Cu conductorsIEEE Transactions on Electron Devices, 1984
- Electromigration in aluminum conductors which are chains of single crystalsApplied Physics Letters, 1981
- Spheroidization of pearliteMetallurgical Transactions A, 1980
- Linewidth dependence of electromigration in evaporated Al-0.5%CuApplied Physics Letters, 1980
- Anomalous large grains in alloyed aluminum thin films II. Electromigration and diffusion in thin films with very large grainsThin Solid Films, 1973
- ELECTROMIGRATION IN SINGLE-CRYSTAL ALUMINUM FILMSApplied Physics Letters, 1970
- Theory of Thermal GroovingJournal of Applied Physics, 1957