A crystalline test specimen for checking the performance of high-resolution electron microscopes
- 31 December 1984
- journal article
- research article
- Published by Elsevier in Ultramicroscopy
- Vol. 13 (4) , 407-413
- https://doi.org/10.1016/0304-3991(84)90006-8
Abstract
No abstract availableKeywords
This publication has 7 references indexed in Scilit:
- Epitaxy by vacuum arc evaporationJournal of Crystal Growth, 1983
- A practical procedure for alignment of a high resolution electron microscopeUltramicroscopy, 1979
- Coma-free alignment of high resolution electron microscopes with the aid of optical diffractogramsUltramicroscopy, 1978
- Measurement of focus and spherical aberration of an electron microscope objective lensUltramicroscopy, 1976
- A test object and criteria for high resolution electron microscopyJournal of Applied Crystallography, 1968
- Notizen: Elektronenmikroskopische Untersuchungen an dünnen KohlefolienZeitschrift für Naturforschung A, 1965
- The Theoretical Resolution Limit of the Electron MicroscopeJournal of Applied Physics, 1949