Coma-free alignment of high resolution electron microscopes with the aid of optical diffractograms
- 31 December 1978
- journal article
- Published by Elsevier in Ultramicroscopy
- Vol. 3, 49-60
- https://doi.org/10.1016/s0304-3991(78)80006-0
Abstract
No abstract availableThis publication has 4 references indexed in Scilit:
- Capacitive measurements of slow fluctuations in high-voltage supplies for electron microscopesJournal of Physics E: Scientific Instruments, 1977
- A procedure for nonlinear least squares refinement in adverse practical conditionsComputer Physics Communications, 1971
- Einige Erfahrungen mit der rechnerischen Analyse und Synthese von elektronenmikroskopischen Bildern hoher AuflösungBerichte der Bunsengesellschaft für physikalische Chemie, 1970
- The Electron Optical System of the Electron MicroscopeJournal of Scientific Instruments, 1947