Surface-structure determinations by means of off-normal photoelectron diffraction: A kinematical analysis
- 15 October 1983
- journal article
- research article
- Published by American Physical Society (APS) in Physical Review B
- Vol. 28 (8) , 4867-4870
- https://doi.org/10.1103/physrevb.28.4867
Abstract
Recent off-normal photoelectron diffraction data of Barton et al. for c(2×2)S on Ni(001) and p(2×2)S on Cu(001) are analyzed using a single-scattering cluster model. The χ(E) curves and their Fourier transforms (FT's) are sufficiently well predicted by this model to permit a detailed analysis of the origins of the FT peaks. No simple connection of these peaks with single nearest-neighbor substrate path-length differences is possible, in contrast with a prior analysis of the same data.Keywords
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