Cumulative Degradation Model and its Application to Component Life Estimation

Publisher Website

1 November 1965

proceedings article
Published by Institute of Electrical and Electronics Engineers (IEEE) in Fourth Annual Symposium on the Physics of Failure in Electronics

p. 74-94
https://doi.org/10.1109/irps.1965.362316

Abstract

No abstract available

This publication has 7 references indexed in Scilit:

Application of the Eyring Model to Capacitor Aging Data
IEEE Transactions on Component Parts, 1965
Failure Analysis of Electronic Parts
IEEE Transactions on Aerospace, 1964
On the extrapolation of accelerated stress conditions to normal stress conditions of germanium transistors
Published by Institute of Electrical and Electronics Engineers (IEEE) ,1963
The Effect of Moisture on Molded Composition Resistors
IEEE Transactions on Component Parts, 1963
Research Toward a Physics of Aging of Electronic Component Parts
Published by Institute of Electrical and Electronics Engineers (IEEE) ,1963
Aspects Affecting the Reliability of a Carbon Composition Resistor
IEEE Transactions on Component Parts, 1963
Factors Affecting Reliability of Alloy Junction Transistors
Proceedings of the IRE, 1956