ProjectileK-Auger-electron production by bare, one-, and two-electron ions

Projectile $K$-Auger-electron production measurements were performed for the bare, one-, and two-electron ions of C, N, O, and F incident on He, Ne, Ar, and Kr gases. The measurements were taken over an energy range of $\frac{1}{4}$ to $\frac{2}{3}$ MeV/amu using a cylindrical mirror analyzer. For the incident two-electron ions, single-electron capture to excited states of the ${\left(1s2s\right)}^{3}S$ metastable component of the incident beam was the principal mechanism giving rise to the observed $K$-Auger transitions. For the bare and one-electron ions, double electron capture to excited states was the dominant mechanism leading to $K$-Auger-electron production. In addition to Auger-spectroscopy measurements, total $K$-Auger production cross sections were determined as well as the partial cross sections for electron capture to specific $n$ levels of the projectile. The $n$ distributions were also measured for double electron capture to excited states of the bare and one-electron ions.