A comparison of positive and negative ion static SIMS spectra of polymer surfaces
- 1 April 1986
- journal article
- research article
- Published by Wiley in Surface and Interface Analysis
- Vol. 8 (2) , 75-81
- https://doi.org/10.1002/sia.740080207
Abstract
No abstract availableKeywords
This publication has 18 references indexed in Scilit:
- A comparison of atom and ion induced SSIMS—Evidence for a charge induced damage effect in insulator materialsSpectrochimica Acta Part B: Atomic Spectroscopy, 1985
- New developments in polymer surface analysisPolymer, 1984
- Static secondary ion mass spectroscopy for study of surface hydrolysis of poly(tert-butyl methacrylate)Analytical Chemistry, 1984
- Biological and Medical Applications of Organic SIMSPublished by Springer Nature ,1983
- A Comparative Study of Organic Polymers by SIMS and FABMSPublished by Springer Nature ,1983
- SIMS Studies of Polymer SurfacesPublished by Springer Nature ,1983
- Analysis of polymer surfaces by SIMS. 2—fingerprint spectra from simple polymer filmsSurface and Interface Analysis, 1982
- Analysis of polymer surfaces by SIMS 1. An investigation of practical problemsSurface and Interface Analysis, 1982
- Comparison of static secondary ion mass spectrometry, ion scattering spectroscopy, and x-ray photoelectron spectroscopy for surface analysis of acrylic polymersAnalytical Chemistry, 1981
- Static secondary ion mass spectrometry of polymer systemsAnalytical Chemistry, 1980