Correction of geometrical distortions in scanning tunneling and atomic force microscopes caused by piezo hysteresis and nonlinear feedback
- 1 September 1994
- journal article
- Published by AIP Publishing in Review of Scientific Instruments
- Vol. 65 (9) , 2864-2869
- https://doi.org/10.1063/1.1144629
Abstract
No abstract availableKeywords
This publication has 10 references indexed in Scilit:
- Scanning tunneling microscope calibration and reconstruction of real image: Drift and slope eliminationReview of Scientific Instruments, 1994
- Compact stand-alone atomic force microscopeReview of Scientific Instruments, 1993
- Restoration of STM images distorted by time-dependent piezo driver aftereffectsUltramicroscopy, 1992
- Scanning-tunneling-microscope study of antiphase domain boundaries, dislocations, and local mass transport on Au(110) surfacesPhysical Review B, 1992
- Fundamental and practical aspects of differential scanning tunneling microscopyJournal of Vacuum Science & Technology B: Microelectronics and Nanometer Structures, 1991
- Picture processing and three-dimensional visualization of data from scanning tunneling and atomic force microscopyIBM Journal of Research and Development, 1991
- The behavior and calibration of some piezoelectric ceramics used in the STMIBM Journal of Research and Development, 1986
- Information- And Image-Processing Of Scanning-Tunneling-Microscope DataPublished by SPIE-Intl Soc Optical Eng ,1986
- Scanning tunneling microscope combined with a scanning electron microscopeReview of Scientific Instruments, 1986
- Electron-metal-surface interaction potential with vacuum tunneling: Observation of the image forcePhysical Review B, 1984