Charge-referencing with Xe during XPS sputter profiles
- 1 January 1986
- journal article
- Published by Elsevier in Journal of Electron Spectroscopy and Related Phenomena
- Vol. 41 (1) , 89-94
- https://doi.org/10.1016/0368-2048(86)80033-0
Abstract
No abstract availableThis publication has 10 references indexed in Scilit:
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