Dislocation sources in discrete dislocation simulations of thin-film plasticity and the Hall-Petch relation
- 19 March 2001
- journal article
- Published by IOP Publishing in Modelling and Simulation in Materials Science and Engineering
- Vol. 9 (3) , 157-169
- https://doi.org/10.1088/0965-0393/9/3/303
Abstract
No abstract availableKeywords
This publication has 26 references indexed in Scilit:
- X-ray diffraction as a tool to study the mechanical behaviour of thin filmsMaterials Science and Engineering: A, 2000
- Quantitative analysis of strengthening mechanisms in thin Cu films: Effects of film thickness, grain size, and passivationJournal of Materials Research, 1998
- Continuum analysis of dislocation pile-ups: influence of sourcesPhilosophical Magazine A, 1998
- On plastic deformation and the dynamics of 3D dislocationsInternational Journal of Mechanical Sciences, 1998
- A simulation of dislocation dynamics and of the flow stress anomaly in L12alloysPhilosophical Magazine A, 1997
- Tensile and fracture behavior of free-standing copper filmsMaterials Science and Engineering: A, 1996
- The yield stress of polycrystalline thin filmsJournal of Materials Research, 1993
- Separation of film thickness and grain boundary strengthening effects in Al thin films on SiJournal of Materials Research, 1992
- Mechanical properties of thin filmsMetallurgical Transactions A, 1989
- The Stability of a Dislocation Threading a Strained Layer on a SubstrateJournal of Applied Mechanics, 1987