Quantifying The Effects Of Amorphous Layers on Image Contrast Using Energy Filtered Transmission Electron Microscopy
- 1 January 1994
- journal article
- Published by Springer Nature in MRS Proceedings
Abstract
No abstract availableKeywords
This publication has 5 references indexed in Scilit:
- Quantitative comparison of high resolution TEM images with image simulationsUltramicroscopy, 1994
- The contribution of inelastically scattered electrons to high resolution [110] images of AlAs/GaAs heterostructuresUltramicroscopy, 1989
- The contribution of inelastically scattered electrons to high resolution images of (Al, Ga)As/GaAs heterostructuresUltramicroscopy, 1988
- Quantitative high resolution transmission electron microscopy: the need for energy filtering and the advantages of energy‐loss imagingJournal of Microscopy, 1988
- Multiple phase formation in the binary system Nb2O5–WO3. III. The structures of the tetragonal phases W3Nb14O44and W8Nb18O69Acta Crystallographica, 1965