A case-study in the use of scan in microSPARC testing and debug

Publisher Website

17 December 2002

conference paper
Published by Institute of Electrical and Electronics Engineers (IEEE)

https://doi.org/10.1109/test.1994.527987

Abstract

No abstract available

This publication has 1 reference indexed in Scilit:

MicroSPARC: a case-study of scan based debug
Published by Institute of Electrical and Electronics Engineers (IEEE) ,2002