MicroSPARC: a case-study of scan based debug
- 17 December 2002
- conference paper
- Published by Institute of Electrical and Electronics Engineers (IEEE)
Abstract
No abstract availableKeywords
This publication has 3 references indexed in Scilit:
- A case-study in the use of scan in microSPARC testing and debugPublished by Institute of Electrical and Electronics Engineers (IEEE) ,2002
- An introduction to the boundary scan standard: ANSI/IEEE Std 1149.1Journal of Electronic Testing, 1991
- Design for Testability—A SurveyIEEE Transactions on Computers, 1982